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SN74LVTH18502APM
- Part No
- SN74LVTH18502APM
- Manufacturer
- Texas Instruments
- Description
- 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | IC SCAN-TEST-DEV/XCVR 64-LQFP
- Test Report
- Available
- Samples
- Available
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- Availability:
- Available
Product Specification
| Specification | Value |
|---|---|
| Direction | Bidirectional |
| High Level Output Current | -32 mA |
| Logic Function | Transceiver |
| Low Level Output Current | 64 mA |
| Max Operating Temperature | 85 °C |
| Max Supply Voltage | 3.6 V |
| Min Operating Temperature | -40 °C |
| Min Supply Voltage | 2.7 V |
| Number of Bits | 18 |
| Number of Channels | 18 |
| Number of Circuits | 2 |
| Number of Elements | 2 |
| Number of Outputs | 18 |
| Operating Supply Voltage | 3.3 V |
| Output Type | TTL |
| Packaging | Bulk |
| Polarity | Non-Inverting |
| Propagation Delay | 20 ns |
| Quiescent Current | 18 mA |
| Schedule B | 8542390000, 8542390000|8542390000|8542390000|8542390000|8542390000 |
| Termination | SMD/SMT |
| Turn-On Delay Time | 20 ns |
| Case/Package | LQFP |
| Contact Plating | Gold |
| Mount | Surface Mount |
| Number of Pins | 64 |
| Weight | 342.689036 mg |
| Height | 1.6 mm |
| Length | 10 mm |
| Thickness | 1.4 mm |
| Width | 10 mm |
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